LABORATORY FOR SEMICONDUCTOR PHYSICS
cod. 23656

Academic year 2007/08
2° year of course - Second semester
Professor
Academic discipline
Fisica della materia (FIS/03)
Field
Discipline fisiche e chimiche
Type of training activity
Characterising
45 hours
of face-to-face activities
4 credits
hub:
course unit
in - - -

Learning objectives

Following this course, the student learns both to make use of some of the basic measurement techniques suitable for characterising the epitaxial structures of seminductor materials and to interpret the results as obtained by these techniques.

Prerequisites

Triennial degree in Physics or in Materials Science and notions of Solid State Physics, Semiconductor Physics and Growth Technology of Crystalline Materials

Course unit content

<br />The program is based on the following basic lab experiments.<br />X-diffraction and the problem of lattice fitting in epitaxial heterostructures.<br />Electrical measurement techniques: preparation of electric contacts ; voltage-current (J/V) measurements, capacitive (C/V) measurements; DLTS; conductivity and Hall effect (short account when using low and high magnetic fields).<br />Optical spectroscopy tecniques: dispersive (absorption, photoconductivity, photo-luminescence) and through Fourier transforms (photoluminescence). For each of the above experiments, a theoretical introduction will be given so as to correctly define the performances of the experimental facilities, their setting and the main characteristics of their forming parts. After that, the sample on which carrying out the measurement will be selected according to the type of measurements and the expected results, in such a way as to get a correlation with results previously obtained with the same sample. The samples selected for measurements will be prepared with suitable processing techniques such as chemical etching, photolithographic methods, metallizations, etc. The best way for fitting the sample to the measuring device will also be determinated. Finally, the collected data obtained by measurements will be worked out and the results analyzed and discussed.

Full programme

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Bibliography

<br />-Dieter K.Schroder “ Semiconductor material and device characterization”<br />- L.Tarricone”Proprietà ottiche e fotoelettroniche dei semiconduttori” (Fisica, Tecnologia e applicazioni dei semiconduttori composti) lezioni della Scuola Nazionale Piano Mia-Murst Tema n°17<br />-C.Ghezzi, Lecture notes of tne corse "Semiconductor Phisycs"<br />- A.Parisini “Trasporto elettrico a bassi e alti campi in semiconduttori” ” (Fisica, Tecnologia e applicazioni dei semiconduttori composti) lezioni della Scuola Nazionale Piano Mia-Murst Tema n°17<br />- M.Wolf, N. Holonyak, G.E. Stillman “Physical properties of semiconductors” Prentice Hall International Edition

Teaching methods

Oral examination.

Assessment methods and criteria

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Other information

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