ANALOGUE AND RF MICROELECTRONICS (UNIT 1)
cod. 1000355

Academic year 2008/09
2° year of course - First semester
Professor
Academic discipline
Elettronica (ING-INF/01)
Field
Ambito aggregato per crediti di sede
Type of training activity
Hub-specific activity
45 hours
of face-to-face activities
5 credits
hub: -
course unit
in - - -

Integrated course unit module: ANALOGUE AND RF MICROELECTRONICS

Learning objectives

<span class="datirigaalto">The course provides advanced knowledge required for approaching the design of Analog Integrated Circuits and RF circuits (with both MMIC or RFIC techniques).</span>

Prerequisites

<span class="datiriga">Suggested:<br />
Elettronica e Strumentazione<br />
Dispositivi a Stato Solido</span>

Course unit content

 <span class="datiriga"><strong>Introduction</strong><br />
Analog integrated circuits design: main differences and peculiarities with respect to discrete-components design.<br />
Passive components in Silicon technologies (resistors, capacitors and inductors): parasitics and lumped models. MOS transistors: main parasitic effects, minimization of the capacitance at the drain terminal; multi-gate devices.<br />
Process tolerance and component mismatch. Interconnection lines: lumped models. Pad, packaging and bonding: models.<br />
Impact of the process tolerance and mismatch on the analog design: corner analysis and Monte-Carlo simulation. <br />
Behavioral modeling of analog cells with Spectre-HDL.<br />
<br />
<strong>Design of operational amplifier in CMOS technology</strong><br />
Two-stages opamp: basic and advanced Miller compensation techniques. Analysis of non-dominant poles and zeros in the transfer function of basic amplifier stages: cascode and differential amplifier. Folded-cascode opamp. CMRR and PSRR of two-stages opamp.<br />
High-DC gain opamps: gain boosting technique. Low supply voltage opamps, rail-to-rail input opamps. <br />
Output stages: class AB; quiescent current control. Class-C.<br />
Micro-power opamps.<br />
Differential output opamps: common-mode feedback and stability issues. Simulation techniques.<br />
<br />
<strong>Noise</strong><br />
Noise sources in single stage amplifier and Miller-compensated two-stages opamps. Noise minimization techniques.<br />
<br />
<strong>Design of special analog circuits in CMOS technology</strong><br />
Switched-capacitor circuits: sample-and-hold, amplifier and filters.<br />
Voltage and current references: CMOS bandgap reference.<br />
<br />
<strong>Theory of Analog Circuit Simulators</strong><br />
Analog Simulators: Spice, Spectre.<br />
DC-OP analysis and algorithms: Newton-Rapson method. DC-OP issues and problems: continuation methods, initial condition, multiple operating points. Accuracy parameters: reltol, vntol and abstol<br />
Transient analysis: integration methods: Euler, Trapezoidal, Gear2; how integration methods affects the simulation results. Accuracy parameters: lteratio, transient convergence criteria (pointlocal, sigglobal, etc.), maximum time-step.<br />
<br />
<strong>Design activity</strong><br />
Design of an analog circuit in CMOS technology (opamp, bandgap reference, etc.) using Cadence as CAD framework and Spectre as Simulator.</span>

Full programme

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Bibliography

<span class="datiriga">B. Razavi, ``Design of Analog CMOS Integrated Circuits'', Mc Graw Hill <br />
P. E. Allen, D. R. Holdberg , "CMOS Analog Circuit Design", 2nd edition, Oxford University Press<br />
K. S. Kundert, “The Designer's Guide to Spice and Spectre”, Kluwer Academic Publ.</span>

Teaching methods

<span class="datirigaalto">The exam comprises an oral part and two designs:<br />
-an analog macro (opamp, bandgap, etc.) to be designed with Cadence<br />
-a LNA to be designed with Agilent ADS<br />
<br />
Design report and cadence database for the Analog IC design part and a report on the design Activity with ADS for the RF Electronics part have to be provided to the Professor before accessing to the exam; <br />
<br />
The oral part, if preferred, may be split in two parts: Analog IC design and RF Electronics.</span>

Assessment methods and criteria

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Other information

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