Learning objectives
The course aims to provide the basic knowledge on the architecture of arithmetic building blocks and to provide the tools for analysis and design of high reliability electronic circuits.
Course unit content
• Architectures of arithmetic building blocks
Datapahts in Digital Processor Architectures
the Adder, problems related to the propagation delay of ripple-carry adder
the Multiplier, serial and parallel circuits based on the Booth’s recoding; dividers.
Floating-Point Arithmetic (IEEE-754) and the shifter
peripheral circuitry
• The testing of electronic systems
- Introduction to the concept of testing
- Reliability and Testing
definition of reliability
fault and defect on the circuit, the fault detection
• fault models
- Failures due to manufacturing defects
- Failures due to defects at the logical level (stuck-at, bridging, short or open)
• major failure mechanisms and their effects on the circuit
• fault diagnosis
- Iddq testing
- Design for testability (DFT)
Scan-path design
Boundary-scan testing
Built-in Self Test
- Examples of tests of complex structures
Tests of memory
Test of FPGAs and microprocessors
• Reliability of systems
- Block diagrams for analysis and prediction of reliability
- Prediction and improvement of reliability
Manuals for the prediction of reliability
• FMEA / FMECA
• Fault tree analysis
Bibliography
They will be shown during the course